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Johannes Niemantsverdriet
SPECTROSCOPY IN CATALYSIS:
An Introduction
ISBN: 3-527-28726-4
Τιμή έκδοσης
Τιμή "Αίθρας"
€ 52,82
€ 40,00
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Catalysis
VCH
300
17 x 24
1η
1995
Μαλακό
Αγγλικά
'Spectroscopy in Catalysis' describes the most important modern analytical techniques used to investigate catalytic surfaces. These include electron spectroscopy (XPS, UPS, AES, EELS), ion spectroscopy (SIMS, SNMS, RBS, LEIS), vibrational spectroscopy (infrared, Raman, EELS), temperature-programmed techniques (TPR, TPO, TDS), diffraction (XRD, LEED, EXAFS), and microscopy (TEM, SEM, STEM, STM, AFM, FEM, and FIM). Each chapter uses current applications to illustrate the type of information that the technique provides and evaluates its possibilities and limitations.
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