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SPECTROSCOPY IN CATALYSIS:
An Introduction

Johannes Niemantsverdriet

SPECTROSCOPY IN CATALYSIS:
An Introduction

ISBN: 3-527-28726-4

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Catalysis

VCH

300

17 x 24

1995

Μαλακό

Αγγλικά

'Spectroscopy in Catalysis' describes the most important modern analytical techniques used to investigate catalytic surfaces. These include electron spectroscopy (XPS, UPS, AES, EELS), ion spectroscopy (SIMS, SNMS, RBS, LEIS), vibrational spectroscopy (infrared, Raman, EELS), temperature-programmed techniques (TPR, TPO, TDS), diffraction (XRD, LEED, EXAFS), and microscopy (TEM, SEM, STEM, STM, AFM, FEM, and FIM). Each chapter uses current applications to illustrate the type of information that the technique provides and evaluates its possibilities and limitations.

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